Energy straggling ofions below 2.0 MeV in Al, Ni, and Au
- 1 February 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 11 (3) , 1013-1019
- https://doi.org/10.1103/physrevb.11.1013
Abstract
Energy straggling of ions has been measured in thin films of Ni, Al, and Au. The observed straggling is roughly proportional to the square root of thickness and appears to have a slight energy dependence for all these materials. The results are compared with predictions of the theories of Bohr, Lindhard and Scharff, and of Chu and Mayer. Both the Ni and Au results are below the predictions of Bohr and are above the predictions of Chu and Mayer, and of Lindhard and Scharff. The Al measurements are above predictions of all these theories.
Keywords
This publication has 14 references indexed in Scilit:
- Energy straggling of 4He below 2 MeV in PtThin Solid Films, 1973
- Principles and applications of ion beam techniques for the analysis of solids and thin filmsThin Solid Films, 1973
- Energy straggling of alpha particles in thick absorbersNuclear Instruments and Methods, 1971
- LOW-TEMPERATURE MIGRATION OF SILICON IN THIN LAYERS OF GOLD AND PLATINUMApplied Physics Letters, 1971
- Energy-Loss Straggling of Protons in SiliconPhysical Review B, 1968
- Straggling distributions of large energy lossesNuclear Instruments and Methods, 1968
- Energy Loss and Straggling of Alpha Particles in Metal FoilsPhysical Review B, 1966
- Stopping Cross Section of Low Atomic Number Materials for He+, 65–180 keVJournal of Applied Physics, 1965
- α-particles straggling in mica and aluminumIl Nuovo Cimento (1869-1876), 1959
- Energy Straggling of ProtonsPhysical Review B, 1948