A simulation-based method for estimating defect-free I/sub DDQ/
- 22 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Iddq test: sensitivity analysis of scalingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- IDDQ and AC scan: the war against unmodelled defectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Current signatures [VLSI circuit testing]Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- So what is an optimal test mix? A discussion of the SEMATECH methods experimentPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A Switch-Level Model and Simulator for MOS Digital SystemsIEEE Transactions on Computers, 1984