Current signatures [VLSI circuit testing]

This publication has 9 references indexed in Scilit:

• "RESISTIVE SHORTS" WITHIN CMOS GATES
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• CMOS IC stuck-open-fault electrical effects and design considerations
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Testing oriented analysis of CMOS ICs with opens
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• A comparison of defect models for fault location with Iddq measurements
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Defect classes-an overdue paradigm for CMOS IC testing
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Topology dependence of floating gate faults in MOS integrated circuits
  Electronics Letters, 1986
• Test Considerations for Gate Oxide Shorts in CMOS ICs
  IEEE Design & Test of Computers, 1986
• Testing for Bridging Faults (Shorts) in CMOS Circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1983