Test Considerations for Gate Oxide Shorts in CMOS ICs
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 3 (4) , 56-64
- https://doi.org/10.1109/MDT.1986.294977
Abstract
Gate oxide shorts are defects that must be detected to produce high-reliability ICs. These problems will continue as devices are scaled down and oxide thicknesses are reduced to the 100-Å range. Complete detection of gate oxide shorts and other CMOS failure mechanisms requires measuring the IDD current during the quiescent state after each test vector is applied to the IC. A 100-percent stuck-at fault test set is effective only if each test vector is accompanied by an IDD measurement. This article examines the need for a fast, sensitive method of measuring IDD during each test vector and discusses problems confronting CMOS IC designers, test engineers and test instrumentation designers as they work to meet these demands.Keywords
This publication has 16 references indexed in Scilit:
- Acceleration Factors for Thin Gate Oxide Stressing8th Reliability Physics Symposium, 1985
- Time-dependent-dielectric breakdown of thin thermally grown SiO2filmsIEEE Transactions on Electron Devices, 1985
- On physical models for gate oxide breakdownIEEE Electron Device Letters, 1984
- On the Acceleration of Test Generation AlgorithmsIEEE Transactions on Computers, 1983
- Testing for Bridging Faults (Shorts) in CMOS CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- A review of fault models for lsi/vlsi devicesSoftware & Microsystems, 1983
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978
- Failure modes and reliability of dynamic RAMSPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1976
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966