Density of states distribution in diamond thin films
- 22 July 1991
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 59 (4) , 455-457
- https://doi.org/10.1063/1.105461
Abstract
Space-charge-limited hole currents in nominally undoped diamond thin films have been studied using thin, highly boron-doped (p+) diamond layers as injecting contacts. The results obtained from these p+-p-Si structures have been analyzed to determine, for the first time, the bulk distribution of localized states N(E) in polycrystalline diamond thin films. The values of N(E), covering an energy range of about 0.8–0.6 eV above the valence band, indicate that the density of states at 0.8 eV is about 1015 cm−3 eV−1 but rises rapidly, within the 0.2 eV, to about 1018 cm−3 eV−1.Keywords
This publication has 14 references indexed in Scilit:
- Densities of states below midgap determined from the space-charge-limited currents of holes in intrinsic hydrogenated amorphous siliconApplied Physics Letters, 1991
- Field-Effect Transistors using Boron-Doped Diamond Epitaxial FilmsJapanese Journal of Applied Physics, 1989
- Diamond electronic devices-a critical appraisalSemiconductor Science and Technology, 1989
- Emerging Technology of Diamond Thin FilmsChemical & Engineering News, 1989
- Large-area a-Si:H TFT arrays for printing, input scanning and electronic copying applicationsJournal of Non-Crystalline Solids, 1987
- The density of states in amorphous silicon determined by space-charge-limited current measurementsPhilosophical Magazine Part B, 1982
- DETERMINATION OF MIDGAP DENSITY OF STATES IN a-Si : H USING SPACE-CHARGE-LIMITED CURRENT MEASUREMENTSLe Journal de Physique Colloques, 1981
- Use of space-charge-limited current measurements to determine the properties of energetic distributions of bulk trapsJournal of Applied Physics, 1980
- Investigation of the density of localized states in a-Si using the field effect techniqueJournal of Non-Crystalline Solids, 1976
- Simplified Theory of Space-Charge-Limited Currents in an Insulator with TrapsPhysical Review B, 1956