Sources of error in accurate orientations determined by electron diffraction
- 16 October 1970
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 3 (2) , 375-381
- https://doi.org/10.1002/pssa.19700030211
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- An accurate method for determining crystallographic orientations by electron diffractionPhysica Status Solidi (a), 1970
- On the accuracy of orientation determination by selected area electron diffractionPhilosophical Magazine, 1968
- The Determination of Orientation from Kikuchi PatternsPhysica Status Solidi (b), 1965
- Applications of Kikuchi Line Analyses in Electron MicroscopyJournal of Applied Physics, 1964
- Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction PatternsPhysica Status Solidi (b), 1964