Preferential sputtering of B studied by low-energy ion scattering using the dual-isotope surface composition (DISC) method
- 2 March 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 227 (3) , 361-368
- https://doi.org/10.1016/s0039-6028(05)80024-x
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Isotopic composition of boron secondary ions as a function of ion-beam fluenceNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Preferential sputtering from isotopic mixtures and alloys of near-neighbor elementsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Computer simulation of two-component target sputteringApplied Physics A, 1985
- Neutralisation of He+ and Ne+ scattered from AgSurface Science, 1983
- ’’NODUS’’—a sensitive new instrument for analyzing the composition of surfacesReview of Scientific Instruments, 1978
- Multiple ion scatteringSurface Science, 1977
- Neutralisation behavior in scattering of low energy ions from solid surfacesNuclear Instruments and Methods, 1976
- Selected topics in low-energy ion scattering: Surface segregation in Cu/Ni alloys and ion neutralizationSurface Science, 1975