Diffraction Investigation on the Structure of SiOx
- 16 August 1979
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 54 (2) , K107-K111
- https://doi.org/10.1002/pssa.2210540250
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Chemical bond and related properties of SiO2 I. character of the chemical bondPhysica Status Solidi (a), 1977
- An analysis of the radial distribution function of SIOxJournal of Non-Crystalline Solids, 1975
- Optical and bonding model for non-crystalline SiOx and SiOxNy materialsJournal of Non-Crystalline Solids, 1972
- Structure of Amorphous Silicon MonoxideJournal of Applied Physics, 1972
- The structure of vitreous silicaJournal of Applied Crystallography, 1969
- Structure of Silicon MonoxideJournal of the Electrochemical Society, 1969
- The Structure of Silicon Oxide FilmsPhysica Status Solidi (b), 1967
- A Study of Amorphous SiOThe Journal of Physical Chemistry, 1959