The determination of characteristic parameters by the temperature dependent field-effect in a-Si:H thin film transistors
- 1 December 1985
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 77-78, 511-514
- https://doi.org/10.1016/0022-3093(85)90710-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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