A Measurement of Induced Charge in CnTCNQ Langmuir-Blodgett Films Sandwiched between Aluminum Electrodes
- 1 July 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (7R)
- https://doi.org/10.1143/jjap.27.1224
Abstract
Electrical properties of C n TCNQ Langmuir-Blodgett films sandwiched between aluminum electrodes are studied using thermally stimulated electrical measurements, and both the effect of film structure and the influence of native aluminum oxide are stressed. A change in induced charges on an electrode (Δq 2) is measured while heating a sample. The relation between Δq 2 and the number of deposited layers is in good agreement with a simple model based on a double-layered dielectric system. The direction of polarization in a film as deposited is also investigated using a photo-induced current measurement.Keywords
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