Grazing-incidence x-ray diffraction characterization of Co-Pt magneto-optical thin films
- 22 March 1993
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 62 (12) , 1353-1355
- https://doi.org/10.1063/1.108676
Abstract
The microstructures of epitaxial CoxPt1−x films (x≊0.25 and 0.5) and the orientation relationships with sapphire (0001) single‐crystal substrates were determined by grazing‐incidence x‐ray diffraction. The epitaxial relationships between the CoPt3 film and its substrate are CoPt3[11̄0]∥Al2O3[303̄0] and CoPt3(111)∥Al2O3(0001). A significant amount of the ordered L12 phase was detected in CoPt3. The degree of long‐range order in CoPt3 was 0.3, and the average domain size of the ordered phase was 80 Å. The CoPt film had two domains related by a 30° in‐plane rotation. The epitaxial relationships between the CoPt film and its substrate were CoPt[100]∥Al2O3[303̄0] and CoPt(011)∥Al2O3(0001) for domain A and CoPt[100]∥Al2O3[112̄0] and CoPt(011)∥Al2O3(0001) for domain B. Domain A was found to be dominant and/or had a higher degree of long‐range order than domain B.Keywords
This publication has 7 references indexed in Scilit:
- Magnetic thin films for data storageThin Solid Films, 1992
- Characterization of epitaxial films by grazing-incidence X-ray diffractionThin Solid Films, 1987
- X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interfaceJournal of Applied Physics, 1979
- Long-range order and ordering kinetics in CoPt3Metallurgical Transactions, 1972
- A New Superlattice in Co-Pt AlloysJournal of Applied Physics, 1952
- Phase Equilibria in an Ordering Alloy SystemJournal of Applied Physics, 1951
- An Approximate Theory of Order in AlloysPhysical Review B, 1950