High-intensity x-ray diffraction apparatus for pressures up to 100 kilobars and temperatures down to 1.5 K
- 1 June 1979
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 50 (6) , 768-771
- https://doi.org/10.1063/1.1135923
Abstract
A high-pressure diamond anvil pressure technique for x-ray structure investigations at temperatures down to 1.5 K is described. An energy dispersive method in conjunction with a newly developed conical x-ray shutter brings maximum intensity to the adjacent germanium detector. Superconductivity is detected by use of a SQUID. The 4096-channel analyzer data are evaluated on-line by a computer. The precision of the lattice parameter determination is discussed.Keywords
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