Investigation of Heavy Particle Induced Latch-Up, Using a Californium-252 Source, in CMOS SRAMs and PROMs
- 1 January 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 31 (6) , 1207-1211
- https://doi.org/10.1109/tns.1984.4333484
Abstract
Heavy ion-induced latch-up, in commercial CMOS SRAMs and PROMs, was examined using a laboratory Californium-252 source, in order to simulate the cosmic environment. The ability to use the CASE system (Californium-252 Assessment of Single-event Effects) enabled detailed electrical measurements to be made of the devices in the latched condition.Keywords
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