Total dose testing of a CMOS charged particle spectrometer
- 1 December 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 44 (6) , 1957-1964
- https://doi.org/10.1109/23.658968
Abstract
A first-generation CMOS Charged Particle Spectrometer chip was designed at JPL for flight on the STRV-2 spacecraft. These devices will collect electron and proton spectra in low Earth orbit as part of an experiment to demonstrate Active Pixel Sensor (APS) technology in space. This paper presents the results of total dose testing on these chips and, where possible, attempts to extend the results to other Active Pixel Sensors.Keywords
This publication has 9 references indexed in Scilit:
- CMOS charged particle spectrometersIEEE Transactions on Nuclear Science, 1996
- Proton effects in charge-coupled devicesIEEE Transactions on Nuclear Science, 1996
- 256×256 CMOS active pixel sensor camera-on-a-chipIEEE Journal of Solid-State Circuits, 1996
- Further measurements of random telegraph signals in proton irradiated CCDsIEEE Transactions on Nuclear Science, 1995
- On-chip p-MOSFET dosimetry (CMOS ICs)IEEE Transactions on Nuclear Science, 1993
- Infrared readout electronics for space-science sensors: state of the art and future directionsPublished by SPIE-Intl Soc Optical Eng ,1993
- Multiply sampled read-limited and background-limited noise performancePublished by SPIE-Intl Soc Optical Eng ,1993
- Effect of radiation-induced charge on 1/f noise in MOS devicesIEEE Transactions on Nuclear Science, 1990
- Fano Factor Fact and FallacyIEEE Transactions on Nuclear Science, 1970