Computer simulation of X-ray spectra of metallic superlattices

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Abstract
A method for the analysis of x-ray diffraction spectra of metallic superlattices using the Monte Carlo technique is presented. Using 'statistical' model of a nonideal superlattice, computer simulation of X-ray spectra has been carried out. The proposed model takes into account a random distribution of superlattice period, grain thickness and interface thickness. The influence of superlattice parameters on X-ray diffraction patterns is discussed.