On the use of convergent-beam electron diffraction for identification of antiphase boundaries in GaAs grown on Si
- 1 January 1988
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 26 (1-2) , 59-63
- https://doi.org/10.1016/0304-3991(88)90377-4
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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