Characterization of avalanche photodiodes for calorimetry applications
- 21 June 1999
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 428 (2-3) , 413-431
- https://doi.org/10.1016/s0168-9002(99)00177-1
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- APD's excess noise measurements using spectral analysis (FFT)Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1997
- A short-wavelength selective reach-through avalanche photodiodeIEEE Transactions on Nuclear Science, 1996
- Automated system for equivalent noise charge measurements from 10 ns to 10 μsNuclear Physics B - Proceedings Supplements, 1993
- Recent results in scintillation detection with silicon avalanche photodiodesIEEE Transactions on Nuclear Science, 1990
- Chapter 3 Silicon and Germanium Avalanche PhotodiodesPublished by Elsevier ,1985
- Theory of carrier multiplication and noise in avalanche devices—Part II: Two-carrier processesIEEE Transactions on Electron Devices, 1979
- Theory of carrier multiplication and noise in avalanche devices—Part I: One-carrier processesIEEE Transactions on Electron Devices, 1979
- The distribution of gains in uniformly multiplying avalanche photodiodes: TheoryIEEE Transactions on Electron Devices, 1972
- Multiplication noise in uniform avalanche diodesIEEE Transactions on Electron Devices, 1966