Mean-free-path concept in polycrystalline metals
- 15 April 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 35 (12) , 6435-6437
- https://doi.org/10.1103/physrevb.35.6435
Abstract
A crude analysis of the observed thickness dependence of the conductivity in fine-grained metals shows a very weak connection with the resistivity caused by grain-boundary scattering. An ‘‘effective intrinsic mean free path’’ for the whole polycrystal, as introduced in the well-known theory of Mayadas and Shatzkes, cannot explain the observed size effect. It is impossible to define a mean free path for the whole polycrystal, especially if the resistivity is governed by grain-boundary scattering.Keywords
This publication has 12 references indexed in Scilit:
- Percolation threshold and mean grain size in AlxSi1-xthin filmsJournal of Physics C: Solid State Physics, 1985
- Mean free path and effective density of conduction electrons in polycrystalline metal filmsThin Solid Films, 1984
- Reduced density of effective electrons in metal filmsThin Solid Films, 1982
- A theoretical description of grain boundary electron scattering by an effective mean free pathThin Solid Films, 1978
- The Mayadas-Shatzkes conduction model treated as a Fuchs-Sondheimer modelThin Solid Films, 1977
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970
- Electrical Resistance of MetalsPublished by Springer Nature ,1965
- Spatial Variation of Currents and Fields Due to Localized Scatterers in Metallic ConductionIBM Journal of Research and Development, 1957
- The mean free path of electrons in metalsAdvances in Physics, 1952
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938