Interactions between thick-film resistors and terminations: the role of bismuth
- 14 February 1986
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 19 (2) , 275-282
- https://doi.org/10.1088/0022-3727/19/2/014
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Evolution of the Microstructure and Performance of Pd/Ag ‐ BasedThick ConductorsActive and Passive Electronic Components, 1984
- The surface conductivity of lead glassesJournal of Physics D: Applied Physics, 1982
- The surface conductivity of bismuth contaminated lead-silicate glassesJournal of Non-Crystalline Solids, 1980
- Influence of the Metal Migration From Screen‐and‐Fired Terminationson the Electrical Characteristics of Thick‐Film ResistorsActive and Passive Electronic Components, 1977