The structure of the p(2×2) tellurium overlayer on the (001) surface of copper investigated by leed
- 1 December 1975
- journal article
- Published by Elsevier in Surface Science
- Vol. 53 (1) , 523-537
- https://doi.org/10.1016/0039-6028(75)90151-x
Abstract
No abstract availableKeywords
This publication has 29 references indexed in Scilit:
- Chemisorption bond lengths of chalcogen overlayers at a low coverage by convergent perturbation methodsJournal of Vacuum Science and Technology, 1975
- The structure of overlayers: I. Se on Ag {001}Surface Science, 1973
- Chemisorption Bonding ofChalcogen Overlayers on Ni(001)Physical Review Letters, 1973
- Application of the-Matrix Perturbation Method to the Analysis of Low-Energy-Electron-Diffraction Spectra for AluminumPhysical Review B, 1973
- Analysis of Low-Energy-Electron Diffraction Intensity Profiles from the (100) and (111) Faces of NickelPhysical Review B, 1973
- Determination of the Adsorption Site by Low-Energy Electron Diffraction for Iodine on Silver (111)Physical Review Letters, 1973
- Low-Energy-Electron Diffraction from Several Surfaces of AluminumPhysical Review B, 1972
- Low-Energy-Electron-Diffraction Spectra from [001] Surfaces of Face-Centered Cubic Metals: Theory and ExperimentPhysical Review B, 1972
- Two-dimensional layers of tellurium on a copper(001) surfaceSurface Science, 1970
- Low-energy electron diffraction intensities from the clean copper (001) surfaceSurface Science, 1969