High energy transmission electron diffraction and imaging studies of the silicon (111) 7 × 7 surface structure
- 31 December 1983
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 11 (2-3) , 117-124
- https://doi.org/10.1016/0304-3991(83)90226-7
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Structure of Si(111)−7 × 7Surface Science, 1983
- Electronic structure of the unreconstructed 30° partial dislocation in siliconPhysical Review B, 1981
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- n-Beam lattice images. III. Upper limits of ionicity in W4Nb26O77Acta Crystallographica Section A, 1973
- Out-of-zone effects in dynamic electron diffraction intensities from goldActa Crystallographica Section A, 1971
- Structure analysis of single crystals by electron diffraction. I. TechniquesActa Crystallographica, 1953