A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope
- 1 September 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (9) , 2870-2873
- https://doi.org/10.1063/1.1144630
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- From Molecules to Cells: Imaging Soft Samples with the Atomic Force MicroscopeScience, 1992
- Using force modulation to image surface elasticities with the atomic force microscopeNanotechnology, 1991
- The influence of lateral forces in scanning force microscopyReview of Scientific Instruments, 1991
- Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscopeApplied Physics Letters, 1990
- Combined scanning force and friction microscopy of micaNanotechnology, 1990
- Force microscopy with a bidirectional capacitance sensorReview of Scientific Instruments, 1990
- Improved fiber-optic interferometer for atomic force microscopyApplied Physics Letters, 1989
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Atomic Force MicroscopePhysical Review Letters, 1986