Atomic structure of grain boundaries in semiconductors studied by electron microscopy (analogy and difference with surfaces)
- 3 October 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 162 (1-3) , 495-509
- https://doi.org/10.1016/0039-6028(85)90940-9
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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