On the measurement of the specific ‘emitter efficiency factor in bipolar transistors’
- 31 December 1972
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 15 (12) , 1293-1294
- https://doi.org/10.1016/0038-1101(72)90121-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Experimental Determination of Gain Degradation MechanismsIEEE Transactions on Nuclear Science, 1971