The double-LNN calibration technique for scattering parameter measurements of microstrip devices
- 1 October 1995
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
This paper presents an alternative way of a network analyzer calibration, in particular an in-fixture calibration. The new double-calibration technique employs the LNN calibration method on both sides of the device under test in order to perform an error-corrected in-fixture measurement. In general, with the double-calibration technique one can determine the corrected scattering parameter of a device under test without removing the device under test during the calibration process.Keywords
This publication has 4 references indexed in Scilit:
- The in-fixture calibration procedure line-network-network-LNNPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1993
- A generalized theory and new calibration procedures for network analyzer self-calibrationIEEE Transactions on Microwave Theory and Techniques, 1991
- A simple broad-band device de-embedding method using an automatic network analyzer with time-domain optionIEEE Transactions on Microwave Theory and Techniques, 1989
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979