The economics of scan design

Publisher Website

13 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1989.82377

Abstract

No abstract available

Keywords

ECONOMICS OF SCAN DESIGN

This publication has 5 references indexed in Scilit:

Design for test and the cost of quality
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Studies in LSI technology economics. III. Design schedules for application-specific integrated circuits
IEEE Journal of Solid-State Circuits, 1987
On yield, fault distributions, and clustering of particles
IBM Journal of Research and Development, 1986
Integrated circuit yield statistics
Proceedings of the IEEE, 1983
Design for testability—A survey
Proceedings of the IEEE, 1983