High resolution electron microscope analysis of lattice distortions and In segregation in highly strained In0.35Ga0.65As coherent islands grown on GaAs (001)
- 15 August 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 86 (4) , 1988-1993
- https://doi.org/10.1063/1.370998
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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