Core‐level shifts and the choice of Auger parameter
- 1 May 1989
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 14 (5) , 257-266
- https://doi.org/10.1002/sia.740140508
Abstract
No abstract availableKeywords
This publication has 33 references indexed in Scilit:
- Study of interfaces in oxidized Fe/Si system by XPS and XAES: Use of the Auger parameterSurface and Interface Analysis, 1986
- The correlation of the auger parameter with refractive index: An XPS study of silicates using Zr Lα radiationSurface and Interface Analysis, 1982
- Two-dimensional chemical-state plot for lead using XPSJournal of Electron Spectroscopy and Related Phenomena, 1982
- Improving the accuracy of determination of line energies by ESCA: Chemical state plots for silicon-aluminum compoundsApplications of Surface Science, 1981
- Further examination of the Si KLL Auger line in silicon nitride thin filmsApplications of Surface Science, 1981
- Bremsstrahlung-induced Auger peaksJournal of Electron Spectroscopy and Related Phenomena, 1980
- Study of transition metal oxides by photoelectron spectroscopyProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1979
- Two-dimensional chemical state plots: a standardized data set for use in identifying chemical states by x-ray photoelectron spectroscopyAnalytical Chemistry, 1979
- X-ray photoelectron spectroscopy with x-ray photons of higher energyJournal of Vacuum Science and Technology, 1978
- Auger parameter in electron spectroscopy for the identification of chemical speciesAnalytical Chemistry, 1975