Substrate effects on the cyclotron resonance in surface layers of silicon
- 1 December 1975
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 17 (11) , 1335-1338
- https://doi.org/10.1016/0038-1098(75)90596-7
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Theory of Cyclotron Resonance Lineshape in a Two-Dimensional Electron SystemJournal of the Physics Society Japan, 1975
- Cyclotron Resonance of Localized Electrons on a Si SurfacePhysical Review Letters, 1975
- Far-Infrared Cyclotron Resonance in the Inversion Layer of SiliconPhysical Review Letters, 1974
- Cyclotron Resonance of Electrons in an Inversion Layer on SiPhysical Review Letters, 1974
- Optical Constants of Far Infrared Materials 2: Crystalline SolidsApplied Optics, 1973
- Cyclotron Resonance in TelluriumPhysical Review B, 1972
- Acoustopolaron reevaluatedPhysics Letters A, 1971