Impurity-diffusion investigations in amorphousTi60Ni40

Abstract
Tracer-diffusion coefficients D of the impurities B, Be, Fe, and Si in the amorphous alloy Ti60 Ni40 have been measured in the temperature range 598–690 K using the technique of secondary-ion-mass spectrometry for concentration depth profiling. The temperature dependence of the measured diffusion coefficients in each case exhibited an Arrhenius behavior and yielded the values of the activation energy Q in units of eV as (2.05±0.14), (2.20±0.15), (2.33±0.14), and (2.35±0.15) for the diffusion of B, Be, Fe, and Si, respectively. The corresponding values of the preexponential factor of the diffusion coefficient D0 in units of m2 s1 were obtained as 7.4×10(4.0±1.1), 1.7×10(3.0±1.2), 2.5×10(3.0±1.1), and 5.8×10(4.0±1.8). The results show the size dependence of D in this alloy according to which the small boron atoms diffuse about 2 orders of magnitude faster than the big silicon atoms while the diffusivities of Be and Fe had intermediate values following the trend DB>DBe>DFe>DSi which is opposite to that of atomic radii r of the diffusing species, i.e., rSi>rFe>rBe>rB. The present data have been compared with those available in other amorphous alloys and in crystalline α-Zr and α-Ti. The notable distinct differences in the diffusion behavior in the amorphous and the crystalline cases are highlighted. On the basis of an observed correlation between the activation energy Q and the prefactor D0 the possible diffusion mechanism in amorphous alloys is discussed.