Impurity-diffusion investigations in amorphous
- 1 March 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 49 (10) , 6655-6666
- https://doi.org/10.1103/physrevb.49.6655
Abstract
Tracer-diffusion coefficients D of the impurities B, Be, Fe, and Si in the amorphous alloy have been measured in the temperature range 598–690 K using the technique of secondary-ion-mass spectrometry for concentration depth profiling. The temperature dependence of the measured diffusion coefficients in each case exhibited an Arrhenius behavior and yielded the values of the activation energy Q in units of eV as (2.05±0.14), (2.20±0.15), (2.33±0.14), and (2.35±0.15) for the diffusion of B, Be, Fe, and Si, respectively. The corresponding values of the preexponential factor of the diffusion coefficient in units of were obtained as 7.4×, 1.7×, 2.5×, and 5.8×. The results show the size dependence of D in this alloy according to which the small boron atoms diffuse about 2 orders of magnitude faster than the big silicon atoms while the diffusivities of Be and Fe had intermediate values following the trend >>> which is opposite to that of atomic radii r of the diffusing species, i.e., >>>. The present data have been compared with those available in other amorphous alloys and in crystalline α-Zr and α-Ti. The notable distinct differences in the diffusion behavior in the amorphous and the crystalline cases are highlighted. On the basis of an observed correlation between the activation energy Q and the prefactor the possible diffusion mechanism in amorphous alloys is discussed.
Keywords
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