On the structure and conduction mechanism of thick resistive films
- 1 September 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 37 (3) , 281-302
- https://doi.org/10.1016/0040-6090(76)90599-x
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Thick Film Resistors with Improved Voltage StabilityIEEE Transactions on Parts, Hybrids, and Packaging, 1974
- An investigation of the relations between the technological parameters, phase constitution and electrical characteristics of thick Pd-Ag resistive filmsThin Solid Films, 1973
- Mechanism of Aging in Pd-Ag Thick-Film ResistorsIEEE Transactions on Parts, Hybrids, and Packaging, 1973
- The Basic Reactions, Compositions, and Electrical Properties of Pd-Ag Thick-Film ResistorsIEEE Transactions on Parts, Hybrids, and Packaging, 1973
- High-Frequency-Discharge Trimming of RuO2-Based Thick-Film Resistors-Part I: Affecting FactorsIEEE Transactions on Parts, Hybrids, and Packaging, 1973
- Relation of the Particle Size of RuO2in Cermet Resistor Inks to the Electrical Properties of Fired ResistorsIEEE Transactions on Parts, Materials and Packaging, 1970
- Pb2M2O7−x (M = Ru, Ir, Re) — Preparation and properties of oxygen deficient pyrochloresMaterials Research Bulletin, 1969
- Electrical Conduction Mechanism in Ultrathin, Evaporated Metal FilmsJournal of Applied Physics, 1962
- The structure of PdOActa Crystallographica, 1953
- The Crystal Structures of the Tetragonal Monoxides of Lead, Tin, Palladium, and PlatinumJournal of the American Chemical Society, 1941