Power MOSFET failure revisited
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 61, 681-688
- https://doi.org/10.1109/pesc.1988.18196
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Avalanche injection and second breakdown in transistorsIEEE Transactions on Electron Devices, 1970
- Power semiconductor ratings under transient and intermittent loadsTransactions of the American Institute of Electrical Engineers, Part I: Communication and Electronics, 1961