Application of coincidence techniques to X-ray fluorescence analysis
- 1 July 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 212 (1-3) , 463-467
- https://doi.org/10.1016/0167-5087(83)90728-7
Abstract
No abstract availableKeywords
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- A High Intensity Source of Polarized X-Rays for Fluorescent Excitation Analysis (FEA)IEEE Transactions on Nuclear Science, 1977
- Possible sources of polarized X-rays for X-ray fluorescence spectra with reduced backgroundsNuclear Instruments and Methods, 1974
- Some aspects of x-ray fluorescence spectrometers for trace element analysisNuclear Instruments and Methods, 1972