Use of the direct energy spectra in Auger electron spectroscopy
- 1 June 1989
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 14 (6-7) , 381-387
- https://doi.org/10.1002/sia.740140615
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Quantitative AES: The establishment of a standard reference spectrum for the accurate determination of spectrometer transmission functionsSurface and Interface Analysis, 1988
- Simulation of the LMM auger spectra of copperSurface and Interface Analysis, 1988
- Quantitative analysis of the inelastic background in surface electron spectroscopySurface and Interface Analysis, 1988
- The spectral background in electron excited Auger electron spectroscopySurface and Interface Analysis, 1988
- Energy distribution of primary backscattered electrons in Auger electron spectroscopyJournal of Vacuum Science & Technology A, 1987
- Depth information in Auger electron spectroscopySurface Science, 1985
- An important step in quantitative auger analysis: The use of peak to background ratioSurface Science, 1984
- Concentration depth profiles by XPS; A new approachSurface Science, 1983
- Linearized secondary-electron cascades from the surfaces of metals. I. Clean surfaces of homogeneous specimensPhysical Review B, 1977
- Linearized secondary-electron cascades from the surfaces of metals. II. Surface and subsurface sourcesPhysical Review B, 1977