Anisotropic and polarization effects in Raman scattering in porous silicon
- 1 January 1995
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 255 (1-2) , 139-142
- https://doi.org/10.1016/0040-6090(94)05639-u
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- The one phonon Raman spectrum in microcrystalline siliconPublished by Elsevier ,2002
- Raman investigation of light-emitting porous silicon layers: Estimate of characteristic crystallite dimensionsJournal of Applied Physics, 1994
- Nanocrystallites in luminescent porous silicon characterized by Raman scatteringJournal of Luminescence, 1993
- A detailed Raman study of porous siliconThin Solid Films, 1992
- Raman analysis of light-emitting porous siliconApplied Physics Letters, 1992
- Correlation of Raman and photoluminescence spectra of porous siliconApplied Physics Letters, 1992
- Angular dispersion of ‘‘backward’’ Raman scattering: Absorbing III-V semiconductors (GaAs)Journal of Applied Physics, 1986
- The effects of microcrystal size and shape on the one phonon Raman spectra of crystalline semiconductorsSolid State Communications, 1986
- Angular dispersion of ‘‘backward’’ Raman scattering: Weakly absorbing cubic materials (Si)Journal of Applied Physics, 1985
- Raman scattering from small particle size polycrystalline siliconSolid State Communications, 1981