Raman scattering from small particle size polycrystalline silicon
- 1 March 1981
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 37 (12) , 993-996
- https://doi.org/10.1016/0038-1098(81)91202-3
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Electroreflectance and Raman scattering investigation of glow-discharge amorphous Si:F:HSolid State Communications, 1980
- Effect of dimensions on the vibrational frequencies of thin slabs of siliconPhysical Review B, 1980
- Polycrystalline silicon films deposited in a glow discharge at temperatures below 250 °CApplied Physics Letters, 1980
- First- and second-order Raman scattering from finite-size crystals of graphitePhysical Review B, 1979
- Recativity of solid silicon with hydrogen under conditions of a low pressure plasmaChemical Physics Letters, 1979
- Raman scattering and SEM studies of graphite and silicon carbide surfaces bombarded with energetic protons, deuterons and helium ionsJournal of Nuclear Materials, 1976
- Heterogeneous Reactions in Non-Isothermal Low Pressure Plasmas: Preparative Aspects and ApplicationsPublished by Walter de Gruyter GmbH ,1976
- Vibrational properties of amorphous Si and GePhysical Review B, 1975
- Temperature Dependence of the Raman Spectrum and the Depolarization Spectrum of AmorphousPhysical Review B, 1973
- The preparation of thin layers of Ge and Si by chemical hydrogen plasma transportSolid-State Electronics, 1968