Emissionsmikroskopische Messung der Ortsverteilung von 20 keV-Elektronen nach Streuung in dünnen Al- und Ge-Aufdampfschichten
- 1 June 1975
- journal article
- Published by Springer Nature in Zeitschrift für Physik B Condensed Matter
- Vol. 22 (2) , 151-159
- https://doi.org/10.1007/bf01322359
Abstract
No abstract availableKeywords
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