EELS microanalysis of the elements Ca to Cu using M23 edges
- 28 February 1993
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 49 (1-4) , 189-197
- https://doi.org/10.1016/0304-3991(93)90225-m
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- M-shell cross-sections for fast electron inelastic collisions based on photoabsorption dataJournal of Electron Spectroscopy and Related Phenomena, 1991
- Determination of inner-shell cross-sections for EELS-quantificationMicroscopy Microanalysis Microstructures, 1991
- Comparison of detection limits for EELS and EDXSMicroscopy Microanalysis Microstructures, 1991
- EELS quantification of the elements Ba to Tm by means of N45 edgesJournal of Microscopy, 1989
- Quantification of electron energy-loss spectra with K and L shell ionization cross-sectionsMicron and Microscopica Acta, 1988
- Inner shell edge profiles in electron energy loss spectroscopyUltramicroscopy, 1985
- An investigation of electron energy loss spectroscopy used for composition analysis of crystalline and amorphous silicidesUltramicroscopy, 1984
- K, L, and M shell generalized oscillator strengths and ionization cross sections for fast electron collisionsThe Journal of Chemical Physics, 1980
- 3p excitations of atomic and metallic Fe, Co, Ni and CuJournal of Physics B: Atomic and Molecular Physics, 1979
- Effects of Configuration Interaction on Intensities and Phase ShiftsPhysical Review B, 1961