Reflectance Difference Spectroscopy: Experiment and Theory for the Model System Si(001):As and Application to Si(001)
- 8 April 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 76 (15) , 2810-2813
- https://doi.org/10.1103/physrevlett.76.2810
Abstract
Reflectance difference spectroscopy (RDS), scanning tunneling microscopy, and calculations of the RDS spectra have been performed for the bare Si(001) surface and Si(001):As, thereby relating identified structures with RDS features. For the As-terminated surface, which exhibits a symmetric As-As dimer structure, we demonstrate excellent agreement between measured and calculated spectra. For clean Si(001), which shows a more complex structure arising from dimer asymmetry, we provide identification of RDS spectral features arising from transitions between dangling-bond surface states.
Keywords
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