Correction of distorted STM image by using a regular crystalline lattice and 2D FFT
- 1 October 1995
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 6 (4) , 105-110
- https://doi.org/10.1088/0957-4484/6/4/001
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- More information on the calibration of scanning stylus microscopes by two-dimensional fast Fourier-transform analysisReview of Scientific Instruments, 1994
- Scanning tunneling microscope calibration and reconstruction of real image: Drift and slope eliminationReview of Scientific Instruments, 1994
- Calibration, drift elimination, and molecular structure analysisJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- Comparison measurement in the hundred nanometer range with a crystalline lattice using a dual tunneling-unit scanning tunneling microscopeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- Computer correction for distorted STM imagesReview of Scientific Instruments, 1992
- Crystalline lattice for metrological applications and positioning control by a dual tunneling-unit scanning tunneling microscopeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Tunneling through a controllable vacuum gapApplied Physics Letters, 1982