More information on the calibration of scanning stylus microscopes by two-dimensional fast Fourier-transform analysis
- 1 September 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (9) , 2860-2863
- https://doi.org/10.1063/1.1145207
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Using capacitive sensors for in situ calibration of displacements in a piezo-driven translation stage of an STMSensors and Actuators A: Physical, 1993
- Polystyrene latex particles as a size calibration for the atomic force microscopeReview of Scientific Instruments, 1991
- Calibration and characterization of piezoelectric elements as used in scanning tunneling microscopyReview of Scientific Instruments, 1991
- Deformations and nonlinearity in scanning tunneling microscope imagesJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Restoration and pictorial representation of scanning-tunneling-microscope dataUltramicroscopy, 1988
- Easy method to characterize a piezoelectric ceramic tube as a displacerReview of Scientific Instruments, 1988
- Response of piezoelectric bimorphs as a function of temperatureReview of Scientific Instruments, 1987
- Tunneling microscopy of graphite in airApplied Physics Letters, 1986
- Real-space observation of the reconstruction of Au(100)Surface Science, 1984
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982