Microsecond spin-flip times innGaAsmeasured by time-resolved polarization of photoluminescence

Abstract
We have observed microsecond spin-flip times in lightly doped nGaAs, by measuring the photoluminescence polarization in the time domain with pump and probe pulses. Times up to 1.4 μs have been measured. Our results as a function of magnetic field indicate three regions governing the spin relaxation: a low field region, where spin-flip times increase due to suppression of the nuclear hyperfine interaction for localized electrons, a medium field region where spin-flip times increase due to narrowing of the hyperfine relaxation for interacting electrons, and a high field region where spin-flip times begin to level off due to the increasing importance of spin-orbit relaxation mechanisms.