An easy and non-destructive induction method to characterize superconducting materials with planar geometry
- 1 May 1991
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 2 (5) , 470-474
- https://doi.org/10.1088/0957-0233/2/5/009
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- X-ray characterization of in-plane ordering in YBa2Cu3O7−x thin films using a standard Weissenberg cameraApplied Physics Letters, 1991
- Magnetic properties and remanent magnetization studies of YBa2Cu3O7 thin filmsJournal of the Less Common Metals, 1990
- Epitaxial YBa2Cu3O7 and GdBa2Cu3O7 thin films grown in-situ by single target d.c. sputteringJournal of the Less Common Metals, 1990
- In-situ YBa2Cu3O7−x thin films epitaxially grown by single target DC sputteringPhysica C: Superconductivity and its Applications, 1990
- Ac-susceptibility measurements on differently prepared YBaCuO-films as a tool to provide an additional quality criterionPhysica C: Superconductivity and its Applications, 1989
- A new inductive method for measuring the critical current density in high-Tc superconducting filmsPhysica C: Superconductivity and its Applications, 1989
- Characterization of YBaCuo films by a.c.-susceptibility measurementsJournal of the Less Common Metals, 1989
- Critical and supercritical current measurements by a magnetic induction methodCryogenics, 1988
- Penetration depths of high T c films measured by two-coil mutual inductancesApplied Physics Letters, 1988
- Improvement of the superconducting properties of YBa2Cu3O 7-x by thermal treatmentJournal de Physique, 1988