X-ray characterization of in-plane ordering in YBa2Cu3O7−x thin films using a standard Weissenberg camera

28 January 1991

journal article
research article
Published by AIP Publishing in Applied Physics Letters

Vol. 58 (4) , 412-414
https://doi.org/10.1063/1.104650

Abstract

We have used a standard Weissenberg camera in the oscillating mode to characterize the in‐plane structure of YBa₂Cu₃O₇ thin films. We find that for films optimally grown on (100) MgO or (100) SrTiO₃ substrates, the in‐plane film axes are aligned parallel to the substrate axes. This is true both for solely c‐axis oriented films (perpendicular to the film plane) and for mixed a‐ and c‐axis oriented films. For a film grown on (110) SrTiO₃, we have established that the film orientation perpendicular to the film plane is solely (103) and not (110) or a mixture of the two. In addition the in‐plane film axes are colinear to the substrate axes.

Keywords

This publication has 3 references indexed in Scilit:

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