Discusssion of ?Microstructural characterization of ?REFEL? (reaction-bonded) silicon carbides?: Authors' reply
- 1 July 1980
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 15 (7) , 1850-1856
- https://doi.org/10.1007/bf00550606
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Intermediate transformation structures in silicon carbideJournal of Microscopy, 1980
- The direct identification of stacking sequences in silicon carbide polytypes by high-resolution electron microscopyActa Crystallographica Section A, 1979
- Discussion of ?Microstructural characterization of ?REFEL? (reaction-bonded) silicon carbides?Journal of Materials Science, 1979
- Electron Microscopy Of Interfaces Between Transforming Polytypes In Silicon CarbideJournal of Microscopy, 1979
- Observations of silicon carbide by high resolution transmission electron microscopyJournal of Microscopy, 1978
- Recrystallization and Phase Transformation in Reaction‐Sintered SicJournal of the American Ceramic Society, 1978
- Microstructural characterization of ?REFEL? (reaction-bonded) silicon carbidesJournal of Materials Science, 1978
- Morphology of the Transformation Interface in Reaction‐Sintered Silicon CarbideJournal of the American Ceramic Society, 1977