Analyse de l'interface oxyde-semiconducteur de AlSb par spectrométrie Auger et diffusion raman
- 1 January 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 76 (1) , 69-76
- https://doi.org/10.1016/0040-6090(81)90067-5
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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