Investigation of neutron-irradiated silicon by diffuse X-ray scattering
- 31 August 1982
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 108-109, 627-634
- https://doi.org/10.1016/0022-3115(82)90534-7
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Observation of small defects in silicon crystal by diffuse x-ray scatteringJournal of Applied Physics, 1979
- High-resolution diffuse X-ray scattering study from nearly perfect silicon single crystalsActa Crystallographica Section A, 1979
- The configuration of atomic defects as determined from scattering studiesJournal of Nuclear Materials, 1978
- Influence of defects and temperature on the annihilation of positrons in neutron-irradiated siliconPhysical Review B, 1976
- X-ray diffuse scattering from silicon containing oxygen clustersJournal of Applied Crystallography, 1975
- New epr spectra in neutron-irradiated silicon (II)Radiation Effects, 1974
- The theory of diffuse X-ray scattering and its application to the study of point defects and their clustersJournal of Physics F: Metal Physics, 1973
- On the Investigation of Small Dislocation Loops in Cubic Crystals by Diffuse X‐Ray ScatteringPhysica Status Solidi (b), 1972
- On Determination of the Double‐Force Tensor of Point Defects in Cubic Crystals by Diffuse X‐Ray ScatteringPhysica Status Solidi (b), 1972