Comparison of kinematic X-ray diffraction and backscattering spectrometry — strain and damage profiles in garnet
- 31 December 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 191 (1-3) , 80-86
- https://doi.org/10.1016/0029-554x(81)90987-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- X-ray study of lattice strain in boron implanted laser annealed siliconJournal of Applied Physics, 1980
- X-ray determination of strain and damage distributions in ion-implanted layersApplied Physics Letters, 1979
- Asymmetric X-ray Bragg reflexion and shallow strain distribution in silicon single crystalsJournal of Applied Crystallography, 1977
- The determination of lattice strain in proton-bombarded regions of single-crystal gallium arsenide, using precision X-ray measurementsJournal of Physics D: Applied Physics, 1977
- Application de la théorie dynamique de la diffraction X à l'étude de la diffusion du bore et du phosphore dans les cristaux de siliciumActa Crystallographica Section A, 1968