Improving wafer sort yields with radius-tip probes

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1990.114109

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

An analysis of tungsten probes' effect on yield in a production wafer probe environment
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003