Application of frequency-domain analysis to RHEED oscillation data: time dependence of AlGaAs growth rates
- 1 May 1991
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 111 (1) , 105-109
- https://doi.org/10.1016/0022-0248(91)90955-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Frequency-domain analysis of time-dependent reflection high-energy electron diffraction intensity dataJournal of Vacuum Science & Technology B, 1990
- Multiple reflection high-energy electron diffraction beam intensity measurement systemReview of Scientific Instruments, 1990
- Reflection high-energy electron diffraction intensity oscillation study of Ga desorption from molecular beam epitaxially grown AlxGa1−xAsJournal of Vacuum Science & Technology B, 1986